tcTestPatternGenerator Class Reference

User Space Control Class for the MityCAM test_pattern_gen FPGA block. More...

#include <TestPatternGenerator.h>

Collaboration diagram for tcTestPatternGenerator:

Public Types
enum	teTestPatternMode {   eeGradientX = 0, eeGradientY = 1, eeStaticCountUp = 2, eeFrameNumberCountUp = 3,   eeStaticVal = 4, eeDEAD = 7 }

Public Member Functions
	tcTestPatternGenerator (uint32_t anControlAddress)
	Construct a new tc Test Pattern Generator::tc Test Pattern Generator object. More...
virtual	~tcTestPatternGenerator ()
	Destroy the tc Test Pattern Generator::tc Test Pattern Generator object. More...
bool	initialized ()
	check and ensure the core has been properly inialized More...
int32_t	reset (bool abOn)
int	setPassThru (bool abPassThru)
int	startTestPattern (bool abStart)
int	setPatternTiming (uint16_t anWidth, uint16_t anHeight, int anPixelsPerClock, float anClockRateMHz, const std::chrono::microseconds &anTargetFrameInterval, unsigned int anVertBlankLines=2)
int	setPatternMode (teTestPatternMode aeMode)
teTestPatternMode	getPatternMode (void)
int	setStaticVal (uint32_t val)
uint32_t	getStaticVal (void)
void	dumpState (void)
	Dump state of CORE to INFO status text. More...

Detailed Description

User Space Control Class for the MityCAM test_pattern_gen FPGA block.

Member Enumeration Documentation

teTestPatternMode

enum tcTestPatternGenerator::teTestPatternMode

Types of available test patterns the core can generate.

Enumerator
eeGradientX	horizontal gradient
eeGradientY	vertical gradient
eeStaticCountUp	incrementing count for each new pixel in raster order. Count starts at static pixel value
eeFrameNumberCountUp	incrementing count for each new pixel in raster order. Count starts at frames count
eeStaticVal	constant pixel value
eeDEAD	0x0000DEAD

Constructor & Destructor Documentation

tcTestPatternGenerator()

tcTestPatternGenerator::tcTestPatternGenerator

(

uint32_t

anControlAddress

)

Construct a new tc Test Pattern Generator::tc Test Pattern Generator object.

Parameters

anControlAddress

32 bit physical address the core is mapped to

~tcTestPatternGenerator()

tcTestPatternGenerator::~tcTestPatternGenerator ( )

virtual

Destroy the tc Test Pattern Generator::tc Test Pattern Generator object.

Member Function Documentation

dumpState()

void tcTestPatternGenerator::dumpState

(

void

)

Dump state of CORE to INFO status text.

getPatternMode()

tcTestPatternGenerator::teTestPatternMode tcTestPatternGenerator::getPatternMode

(

void

)

Returns

the current set test pattenr mode.

getStaticVal()

uint32_t tcTestPatternGenerator::getStaticVal

(

void

)

Returns

the programmed static value for test pattern generation logic.

initialized()

bool tcTestPatternGenerator::initialized

(

)

check and ensure the core has been properly inialized

Returns

true when memory map access has been established to the core

false when memory map access to the core was not established

reset()

int32_t tcTestPatternGenerator::reset

(

bool

abOn

)

Enable / Disable core reset.

Note

the reset bit does not halt the test pattern data generation engine, it only disables the output frame creation from running (header_create block). In a similar way, asserting reset will also not stop frames from flowing if the passthru mode is enabled. You should probably make the appropriate calls to setPassThru() and startTestPattern() when using this routine.

Parameters

abOn	when true, reset the core.

Returns

non-zero on error.

setPassThru()

int tcTestPatternGenerator::setPassThru

(

bool

abPassThru

)

Enables passthru mode. This will override testpattern mode if it is enabled and could create a break in the stream data if the core is running test pattern data and not in reset.

Parameters

abPassThru

when true, enable pass through mode.

Returns

non-zero on error.

setPatternMode()

int tcTestPatternGenerator::setPatternMode

(

teTestPatternMode

aeMode

)

Set the test pattern type.

Parameters

aeMode

the mode to drive

Returns

non-zero on error.

setPatternTiming()

int tcTestPatternGenerator::setPatternTiming	(	uint16_t	anWidth,
		uint16_t	anHeight,
		int	anPixelsPerClock,
		float	anClockRateMHz,
		const std::chrono::microseconds &	anTargetFrameInterval,
		unsigned int	anVertBlankLines = 2
	)

Configure the width, height, horizontal (backside) and vertical (frontside) porch timing for test pattern generation based on the provided parameters.

Parameters

anWidth	width of output in pixels
anHeight	height of output in pixels
anPixelsPerClock	number of pixels per clock in the pipeline (must be known)
anClockRateMHz	the clock rate of the pipeline
anTargetFrameInterval	the desired frame interval time, in microseconds
anVertBlankLines	the desired number of blanking rows (default of 2)

Returns

non-zero on error.

setStaticVal()

int tcTestPatternGenerator::setStaticVal

(

uint32_t

val

)

Sets the static value for the test pattern generation logic.

Parameters

val

the value

Returns

non-zero on error.

startTestPattern()

int tcTestPatternGenerator::startTestPattern

(

bool

abStart

)

Start Test Pattern Engine. Start the test pattern engine internal data generation. This will have no effect if pass through is enabled. If reset is enabled, the output will not be generated until reset is released.

Parameters

abStart

when true start test pattern generator data.

Returns

non-zero on error.

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The documentation for this class was generated from the following files:

• /tmp/mitycam_sdk/ARM/camera_software/src/Utility/TestPatternGenerator.h
• /tmp/mitycam_sdk/ARM/camera_software/src/Utility/TestPatternGenerator.cpp